COMET YXLON CHEETAH EVO–MICROFOCUS / NANOFOCUS
X-ray Inspection System for PCBA and Semiconductors
Key Benefits
- Ultimate quality resolution for failure analysis applications
- High-performance CT inspection for all demanding applications
- Highest industry CT reconstructions with VGStudio and Siemens Software
Applications
- Wafer inspection
- 3D integrated circuit joints
- Microbumps
- Sensors
- MEMS and MOEMS
- TSV’s