Features:
Modular Design
Automatic Loading and Unloading
Wafer Pre-Alignment
Support Dual Inspection Station
Image Processing Capability
Comprehensive Vision Inspection Tools
High Definition Composite 3D Inspection*
Artificial Intelligent*
Sigma Series INTELLIGENT WAFER AOI MACHINE
A high throughput and reliable inspection on defects for various wafer types with high resolution color 2D imaging and fully automated wafer handling mechanisms. Ideal Vision’s patented HDCompozite™ combines both 2D imaging and 3D metrology to deliver an exceptional inspection for bump height as an optional enhancement. The system is also powered by JÄGER® vision software that designed for high speed and precise vision inspection application.